Quasi-Non-destructive Characterization of Carburized Case Depth by an Application of Centerless X-ray Diffractometers

Abstract A new application of a centerless x-ray diffractometer was proposed that goes beyond residual stress measurements during the regular operation such equipment. During depth measurement, it is possible to fit measured interference function ferrite (211) with different number curves as depth. The corresponded appearance fractions grain sizes and concentrations in ferrite, perlite, bainite, or martensite. Accordingly, microstructures were non-destructively detected through thickness carburized layer, good correlation found results from metallography hardness testing. This novel method validated on solid gas samples, but more work needed apply other microstructures.